F | Fluorine |
FA | Failure Analysis |
FAA | Federal Aviation Administration |
FAB | Fast Atom Bombardment |
FALC | Frame And Line interface Component |
FAMOS | Floating-gate Avalanche-injection Metal-Oxide Semiconductor |
FAQ | Frequently Asked Questions |
FAR | Failure Analysis Report |
FB | Free to Bound (process) |
FC | Field Cooling; Flip Chip |
FCC | Face Centered Cubic; Federal Communications Commission; Flat Conductor Cable |
FCM | Facilities Cost Model |
FCODE | Forth Code (PCI device driver programming language) |
FCS | Factory Control System |
FDA | Food and Drug Administration |
FDC | Fault Detection and Classification; Floppy Disc Controller |
FDD | Floppy Disk Drive; Frequency Division Duplex |
FDE | Frequency Domain Experiments |
FDM | Frequency Division Multiplexing |
FDMS | Flash Desorption Mass Spectrometry |
Fe | Iron |
FE | Free Exiton; Fermi Energy |
FEA | Finite Element Analysis |
FEC | Fabrication Evaluation Chip; Forward Error Correction |
FED | Field Emissive Display |
FEG | Field Emission Gun |
FEL | Free Electron Laser |
FEM | Finite Element Method |
femto | 1.00E-15 (1/1,000,000,000,000,000; symbolized by the prefix f) |
FEOL | Front-End Of Line |
FEP | Fluorinated Ethylene-Propylene (Teflon) |
FESEM | Field Emission Scanning Electron Microscope |
FET | Field Effect Transistor |
FFT | Fast Fourier Transform |
FG | Finished Goods |
FI | Filterability Index; Factory Integration |
F/I | Final Inspect |
FIB | Focused Ion Beam |
FIC | Fluid Integrated Circuit |
FID | Flame Ionization Detector |
FIFO | First-In, First-Out |
FIM | Field Ion Microscopy |
FIR | Far InfraRed |
FIT | Failure unit |
FL | Fuzzy Logic |
FLAPW | Full potential Linearized APW |
FLIR | Forward Looking Infrared |
FLOODS | FLorida Object-Oriented Device Simulator |
FLOOPS | FLorida Object-Oriented Process Simulator |
FLOPC | FLoating point Operations needed Per Cycle |
FLOTOX | FLOating gate Tunnel OXide |
FLP | Fermi Level Pinning |
FLRT | Factory Layout/Relayout Tool |
Fm | Fermium |
FM | Foreign material; Ferro Magnetic; Frequency Modulation |
FMEA | Failure Mode and Effects Analysis |
FMMC | Factory Material Movement Component |
FMS | Forms Management System |
FMS | Forms Management System |
FMVP | Framework Member Validation project |
FNN | Feed-forward Neural Network |
FOCS | Fiber Optic Chemical Sensors |
FOLZ | First-Order Laue Zone |
FOMP | First Order Magnetization Process |
FOUP | Front Opening Unified Pod |
FOV | Field Of View |
FOX | Field OXide |
FP | Flash Point |
FPA | Focal Plane Array |
FPAA | Field Programmable Analog Array |
FPD | Focal-Plane Deviation; Flat Panel Display |
FPD-RAM | Fast Page DRAM |
FPGA | Field-Programmable Gate Array |
FPLA | Field-Programmable Logic Array |
FPLF | Field-Programmable Logic Family |
FPLS | Field-Programmable Logic Switch |
FPM | Flexual Plate Mode |
FPMS | Factory Performance Modeling Software |
FPROM | Field-Programmable Read-Only Memory |
FPT | Fine Pitch Technology |
FPX | Kodak Flashpix image format |
FQA | Fixed Quality Area |
FQHE | Fractional Quantum Hall Effect |
Fr | Francium |
FRAC | Frame Aligner Circuit |
FRACAS | Failure Reporting, Analysis, and Corrective Action System |
FRAM | Ferroelectric RAM (q.v.) |
FRAME | Failure Rate Analysis and Modeling |
FRMB | Fast Ramp Mini Batch |
FSCM | Federal Stock Code for Manufacturers |
FSE | Field Scanned (Stepped) ENDOR |
FSG | Fluorinated Silicate Glass |
FSK | Frequency Shift Keying |
FSM | Finite State Machine |
FS-PAL | Field Sequential Phase Alternation Line |
FSS | Full Scale Span |
FT | Final Test; Fourier Transform |
FTA | Fault tree analysis; Free-To-Air |
FTAB | Focus Technical Advisory Board |
FTIR | Fourier Transform InfraRed |
FTL | Flash Transition Layer |
FTP | File Transfer Protocol |
FTPL | Fourier Transform Photo Luminescence |
FTTC | Fiber-To-The-Curb |
FTTD | Fiber-To-The-Desk |
FTTH | Fiber-To-The-Home |
FW | Full Wave |
FWHM | Full Width at Half Maximum |
FWHP | Full Width at Half Peak (=FWHM) |
FYI | For Your Information |
FZ | Float Zone |